Quantitative Light Element Analysis Using Neutron Depth Profiling

Dr. Jamie Weaver
National Institute of Standards and Technology

Neutron Depth Profiling (NDP) is a nuclear activation method that is highly sensitive to Li, B, N, and He. Historically, NDP was developed at NIST to study B doping in semi-conductor materials, but modern applications have focused on measuring Li diffusion profiles in Li-ion batteries, B diffusion in analogue ancient glass alteration materials, B loading onto calibration targets for the National Ignition Facility, and He implantation resilience of next generation nuclear fusion reactor materials. In this talk the physics and chemistry behind NDP will be introduced followed by several vignettes of NDP applied to real world material science problems. An overview will be provided of the NIST Center for Neutron Research user facility and other, pandemic related projects that are currently underway at NIST.

Hosted by Dr. Manukyan

All interested persons are invited to attend remotely—email nsladmin@nd.edu for information.